Abstract: Leaf structure parameters of different types of wheat varieties were quantitatively described, and analytic models and a deduction system for simulation of wheat leaf shape and LAI development along with growth stages established. The system can analyze single leaf vertex and cumulative projection leaf area for different wheat height intervals, interspace directions and leaf angle direction distributions. The models can be used for description of winter wheat canopy structure. The deduction system can be used for precise calculation of cumulated projection leaf area for specific height intervals and integrated evaluation of plant shape. The deduction system can also be used in analysis and application of multi angle remote sensing data to monitor crop growth status.