Computer Vision Method for Measuring Defect Area of SphereFruits
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Graphical Abstract
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Abstract
The purpose of this paper is to improve the measuring accuracy of surface defect area of spherefruit by computer vision method.The problem of determining the defect area by umbriferous image was analysed. The methods of pixel transform and boundary transform that can recover the geometrical feature of spherefruit surface defect from umbriferous image were established,and verified by experiment.The results showed that both methods can reduce the relative errors by about 35 %.
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